Dr. Bernie Creaven (IT Tallaght) presented her work on Cu(II) Complexes in Cancer Cells at the Irish Biological Inorganic Chemistry Society IBICS-1 Symposium in Maynooth last week. The imaging work in this study was carried out in collaboration with the NRF @DCU using our Leica SP8.
PolyPico Technologies in partnership with Dublin City University is proud to present the PicoPRESISE our Next Generation ultra-low volume, micro-drop dispensing system prior to its official launch at TechConnect NanoTech Expo, Washington DC.
You are invited to a Demonstration of the PicoPRESICE on 3rd May, 2017. in NRF building Room GA104 at 11 am, 11.30 am, and 12pm
The NRF is delighted to announce it's new particle size analysis capabilities!
We have recently taken delivery of a new Malvern Mastersizer 3000 particle size analyser. The Mastersizer 3000 is a laser diffraction particle size analyzer that delivers rapid, accurate particle size distributions for both wet and dry dispersions. It is capable of measuring over the nanometer to millimeter particle size ranges.
We are also is in the process of installing a Bekman Coulter Delsa Nano C. This is dynamic light scattering analyzer which can measure nano particle size and zeta potential. Keep an eye on our website in the coming weeks as these will be soon available for access and training.
Congratulations to Dr. Andrew Kellett's group for their two recent publications! Both papers include work that was carried out on NRF equipment.
In their Nucleic Acids Research publication "C3-symmetric opioid scaffolds are pH-responsive DNA condensation agents" , they used the AFM in the NRF to visualize DNA condensation induced by a tripodal scaffold and the CD to investigate opoid-DNA binding
In their Redox Biology paper "Triggering autophagic cell death with a di-manganese(II) developmental therapeutic" , they used the CD spectrometer to investigate drug-DNA binding interactions and the NRF Leica SP8 STED to acquire confocal images of SKOV3 cancer cells treated with a manganese complex.
The NRF's newest equipment has just arrived!
We have just taken delivery of a new Perkin Elmer Spectrum Two FTIR Spectrometer and a Perkin Elmer LS55 Fluorescence Spectrometer!
Spectrum Two™ is the IR spectrometer of choice for everybody, everywhere. Ideally suited to everyday analysis, you can confidently perform fast, accurate IR analysis and assure the quality of your materials across a wide range of applications. Breaking new ground in operational simplicity, Spectrum Two combines superb performance with a low maintenance design.
The standard configuration of Spectrum Two, is suitable for a wide range of applications and includes a high performance detector, a standard sample compartment with sample slide mount and the comprehensive Spectrum 10™, and Spectrum 10™ Upgrade software interfaces. Additionally, a configuration with a DTGS detector is also available.
For more information and to request access click
The Perkin Elmer LS 55 luminescence spectrometer is a very versatile instrument that allows measurement of fluorescence, phosphorescence, and chemiluminescence or bioluminescence of a liquid, solid, powder, or thin film sample. The instrument is simple to operate and is controlled by easy-to-use software.
For more information and to request access click here
Get 2017 off to a well defined and characterised start with our Surface Metrology Seminar and Workshop on February 8th and 9th in the NRF @ DCU. See what can be done with AFM, Stylus profilometry and Optical profilometry. With hands-on sessions and talks by Bruker Applications Engineers. Please click here to register for this workshop.
We have recently taken receipt of our new Bruker Contour GT 3D optical microscope! This is a white light interferometric surface profiler allowing for nanometer-scale resolution on surfaces. For more information and to request access click here
Also, our new Perkin Elmer LS55 Fluorescence Spectrometer and Spectrum two FTIR are being delivered and installed this week! More information to follow.
We are delighted to announce the arrival and installation of our new Bruker Dektak XT Stylus Profiler. This new stylus profiler can be used to perform sub-nanometer height, step and surface roughness measurements on an array of sample types.
Congratulations to Dr. Robert Groarke (Advanced Processing Technology Research Centre, Dublin City University) who won the Genzo Shimadzu Best Poster and Flash Oral Presentation in the International Symposium on Chromatography 2016.
His work involves the fabrication of High Performance Thin Layer Chromatography plates using the Connex 3D printer in the NRF