Profilometry

Profilometry

Stylus Profilometry

Bruker Dektak XT Stylus profiler 

This stylus profiler can be used to perform nanometer scale height, step and surface roughness measurements on an array of sample types. 

The Dektak XT features an innovative single-arch design that provides excellent platform stability along with "smart electronics" that results in a low-noise system.  Dektak is the only stylus profiler to measure large vertical features of sensitive materials (up to 1mm tall) with angstrom-level repeatability

The applications for this system are numerous, 

  • Thin Film Inspection - monitoring deposition and etch rates and thin film stresses. 
  • Surface Roughness Verification
  • Microfluidics — Verifying Design and Performance

Prices:

Academic:  €5/hr

Industry:     On Request

Contact:

Admin: research.facilities@dcu.ie

Technical: barry.oconnell@dcu.ie


Optical profilometry

BRUKER Contour GT 3d Optical microscope

  • Unique metrology sensor design with patented dual-LED light source
  • Self-calibrating, metrology optimizing laser reference
  • Integral vibration-isolation floor-mount cabinet
  • Fully automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV)
  • Nanometer-scale resolution on high-contour surfaces
  • Streamlined, customizable production interface
  • Real-time automated measurement optimization
  • Extensive library of filters and customizable analysis options

Contact:

Admin: research.facilities@dcu.ie

Technical: barry.oconnell@dcu.ie

Prices:

Academic:  €5/hr

Industry:     On Request

Bruker countour gt optical profiler