Surface Analysis

Surface Analysis

Stylus Profilometry

Bruker Dektak XT Stylus profiler 

This stylus profiler can be used to perform nanometer scale height, step and surface roughness measurements on an array of sample types. 

The Dektak XT features an innovative single-arch design that provides excellent platform stability along with "smart electronics" that results in a low-noise system.  Dektak is the only stylus profiler to measure large vertical features of sensitive materials (up to 1mm tall) with angstrom-level repeatability

The applications for this system are numerous, 

  • Thin Film Inspection - monitoring deposition and etch rates and thin film stresses.

  • Surface Roughness Verification

  • Microfluidics — Verifying Design and Performance

Prices:

Academic:  €5/hr

Industry:     On Request

Contact:

Admin: research.facilities@dcu.ie

Technical: barry.oconnell@dcu.ie


Optical profilometry

BRUKER Contour GT 3D Optical microscope

  • Unique metrology sensor design with patented dual-LED light source

  • Self-calibrating, metrology optimizing laser reference

  • Integral vibration-isolation floor-mount cabinet

  • Fully automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV)

  • Nanometer-scale resolution on high-contour surfaces

  • Streamlined, customizable production interface

  • Real-time automated measurement optimization

  • Extensive library of filters and customizable analysis options

Contact:

Admin: research.facilities@dcu.ie

Technical: barry.oconnell@dcu.ie

Prices:

Academic:  €5/hr

Industry:     On Request

Bruker countour gt optical profiler

Nanoindentation

Nanoindentation at DCU
Displacement curve

Bruker HYSITRON TI Premier

This is an automated nano-mechanical test instrument for measuring the hardness, elastic modulus, fracture toughness and other mechanical properties using controlled nanoindentation of materials. Imaging of indentations can then be carried out with the indenter head or the integrated optics. Our system is installed on low vibration platform, improving measurement quality. 

The system has a range of applications which include:

  • Investigating mechanical behavior of surfaces and ultra-thin coatings

  • Measuring the modulus and mechanical properties of interfaces and individual phases

  • Measuring the viscoelastic properties of polymers and biological materials down to the cellular level

Prices:

Academic:  €13/hr

Industry:     On Request

Contact:

Admin: research.facilities@dcu.ie

Technical: barry.oconnell@dcu.ie


Contact Angle

FTA200 Dynamic Contact Angle Analyser

This analyser has a flexible video system which is used for measuring Contact Angle, Surface Tension, Interfacial Tension, Wettability and Absorption. Surface Energy can also be measured as a direct function of Surface Tension and/or Contact Angle. 
The instrument hardware consists of a high resolution CCD camera, a zoom microscope, an adjustable sample stage, a PC-controlled syringe pump, PC-controlled lighting (front & rear) and the PC itself, which hosts the PCI frame-grabber card (for video capture). The versatility of the system allows it to be configured in a number of different ways, although the vast majority of measurements are taken in the configuration shown in the image here/above/below.

This versatility is echoed within the analysis software, where image analysis can vary between fully automatic and fully manual, depending on the complexity of the image. The analysis is performed on true gray-scale images (not silhouette-style images!), thereby enhancing the sample detail and explicit graphics allow the operator to determine exactly where the software algorithms have found the drop and specimen edges.

  • The software can calculate many quantities of interest from the drop shape, including: static, equilibrium, capillary, advancing & receding Contact Angle

  • Pendant drop & sessile drop Surface Tension

  • Pendant drop & drop volume Interfacial Tension

  • Sessile drop Spreading and Adsorption

  • Critical Micelle Concentration & Critical Wetting Tension. 

Many of these parameters are available as dynamic measurements (i.e. as a function of time) and the time-scale can vary from 1/60th of a second (single image) to several hours. The measurement intervals can also be varied non-linearly in order to track Adsorptions much more efficiently. 

IMG_20190131_142506_ed.jpg

Prices:

Academic:  On Request

Industry:     On Request

Contact:

Admin: research.facilities@dcu.ie

Technical: stephen.fuller@dcu.ie